Real-time WIP Shelf life Tracking with Barcode Technology for Defects Reduction. Applied Engineering, Innovation, and Technology, [S. l.], v. 1, n. 1, p. 1–13, 2024. DOI: 10.62777/aeit.v1i1.12. Disponível em: https://journal.msdinstitute.org/index.php/AEIT/article/view/12.. Acesso em: 22 dec. 2024.